Research
Articles
Highly Tunable Synaptic Modulation in Photo-Activated Remote Charge Trap Memory for Hardware-Based Fault-Tolerant Learning
Category : International Journal Editor : 황도경 Published Date : 2025.01 Publications : Advanced Materials
Highly Tunable Synaptic Modulation in Photo-Activated Remote Charge Trap Memory for Hardware-Based Fault-Tolerant Learning

